Syllabus

Winter Quarter, 2006

Physics 243B

Surface Physics of Materials: Structure and Microscopy

CRN 73660, 3 Units

Time: Tues., Thurs. 10:30 – 11:50 a.m.

First class: Thurs. Jan. 5, 2006

Place: 158 Roessler

Instructor: Shirley Chiang, 215 Physics Geology

tel: 530-752-5989, FAX: 530-752-4717

e-mail: chiang@physics.ucdavis.edu

Class Web page: http://www.physics.ucdavis.edu/classes/Phys243B/Phys243B.html

Research Web page: http://www.physics.ucdavis.edu/stm/index.htm

Office Hours: Thurs. 12:00-1:00 p.m. 215 Phy/Geo

Also by appointment.

Textbooks:

· "Modern Techniques of Surface Science--Second Edition," D.P. Woodruff and T.A. Delchar, (Cambridge Univ. Press, 1994).

· "Physics at Surfaces," A. Zangwill (Cambridge Univ. Press, 1988).

· Reprints of review articles to be handed out in class.

First Reading Assignment:

Woodruff & Delchar, Chapters 1 and 2

Zangwill, Chapters 2 and 3

Other Reference Books (will be on reserve at Shields Library)

1. M. Prutton, Introduction to Surface Physics, Oxford University Press (1994).

2. T. A. Delchar, Vacuum Physics and Techniques, Chapman and Hall (1993).

3. G. Ertl and J. Küppers,. Low Energy Electrons and Surface Chemistry, Weinheim, Germany (1985).

4. M. A. Van Hove, W.H. Weinberg, C.-M. Chan, Low-Energy Electron Diffraction : Experiment, Theory, and Surface Structure Determination, Springer-Verlay, Berlin, (1986).

5. G. A. Somorjai, Chemistry in Two Dimensions : Surfaces, Cornell University Press, Ithaca (1981).

6. G. A. Somorjai, Introduction to Surface Chemistry and Catalysis, Wiley, New York (1994).

7. C. J. Chen, Introduction to Scanning Tunneling Microscopy, Oxford University Press, New York (1993).

8. Joseph A. Stroscio and William J. Kaiser, editors, Scanning Tunneling Microscopy, Academic Press, Boston (1993).

9. H.-J. Güntherodt, R. Wiesendanger, eds., Scanning tunneling microscopy I, II, III, Springer-Verlag, New York (1992,1994,1995)

10. Dror Sarid, Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces, Oxford University Press, New York (1991).

11. "Introduction to Surface and Thin Film Processes," John A. Venables (Cambridge Univ. Press, 2000). http://venables.asu.edu/grad/appweb1.html

Performance Assessment:

· Graded problem sets (3 total) 40%

· One midterm exam 20%

· Final term paper 30%

· Final oral presentation 10%

Term Paper and Oral Presentation:

*Term paper suggested length 10-20 pages, double spaced, plus references in addition.

*Oral Presentation: 20 minutes, using viewgraphs and figures, followed by questions

from other students, typically 5-10 minutes.

Topic for term paper and oral (same topic for both):

Pick a surface science system and look for papers in the original literature describing how several different surface analytical techniques were used to determine the surface structure and properties. If there are any theoretical papers on the topic, discuss their connection to the experimental ones. Explain why this particular system is of scientific interest.

Please consult instructor before you choose a topic. You are welcome to pick a topic relevant to your research.

Examples of possible topics:

Si(111) 7x7 reconstruction

Au(111) reconstruction

Ag/Si(111) overlayer

O/W(110) 2x1, 2x2, 1x1 overlayers

Course Topics Covered:

· Introduction to Surface Science

· Rationale for studying surfaces

· Production of ultrahigh vacuum

· Methods for cleaning surfaces

· Brief overview of several surface analytical techniques—X-ray photoemission spectroscopy (XPS), Auger spectroscopy, low energy electron diffraction (LEED)

· Surface structure—2D Bravais lattices, reciprocal lattices, overlayer structures and nomenclature, diffraction patterns

· Low energy electron diffraction –(LEED)

· General kinematic theory

· Surface reconstructions

· Adsorbate overlayers

· Antiphase domain boundaries

· Stepped and kinked surfaces

· Dynamical LEED theory

· Other surface scattering techniques for determining structure

· Reflection high energy electron diffraction (RHEED)

· Helium atom scattering (HAS)

· X-ray techniques for surface structure

· Surface X-ray diffraction

· X-ray standing waves

· Extended X-ray absorption fine structure (EXAFS), NEXAFS (near-edge EXAFS)

· Incident ion techniques

· Ion scattering techniques—low energy ion scattering (LEIS), medium energy ion scattering (MEIS), high energy ion scattering (HEIS)

· Sputtering and depth profiling

· Secondary ion mass spectroscopy (SIMS)

· Vibrational spectroscopy as a structural analysis technique

· RAIRS—reflection-absorption infrared spectroscopy

· HREELS—high resolution electron energy loss spectroscopy

· IETS—inelastic tunneling spectroscopy

· SERS—surface enhanced Raman spectroscopy

· Desorption spectroscopies

· Thermal desorption spectroscopy (TDS)

· Laser-induced thermal desorption (LITD)

· Electron stimulated desorption ion angular distribution (ESDIAD)

· Surface Microscopies

· Field emission microscopy (FEM)

· Field ion microscopy (FIM)

· Scanning tunneling microscopy (STM)

· Atomic force microscopy (AFM)

· Transmission electron microscopy (TEM)

· Scanning electron microscopy (SEM)

· Low energy electron microscopy (LEEM)

· Variations of the above combined with spectroscopy

· Epitaxy

· Growth modes—effects of surface free energies

· Surface alloys

· Effects of orientation and strain

· Effect of surfactants

· Chemical Reactions at Surfaces

· Chemisorbed adsorbates

· Catalytic reactions

· Molecular beam techniques for determination of energy transfer, state selection

· Surface Phase Transitions

· Adsorbate structure of physisorbed and chemisorbed systems

· Surface magnetism

· Critical exponents