Surface Analysis Systems
There are two primary surface analysis systems in our group:
1) The first system is attached to the variable temperature STM and the low temperature AFM.
Samples can be transferred in-situ between the systems, allowing them to be characterized
by both surface science techniques and STM/AFM. In addition it contains a loadlock system, to
allow samples to be exchanged without breaking vacuum. This system is equipped for the chemical
(XPS, TPD) and structural (LEED) analysis of the near surface regions. In addition, facilities
exist for sample preparation/cleaning, gas dosing and thin film deposition. Plans are being
developed to add a system for measuring the magnetic properties of systems using the magneto-optic
Kerr effect.
2) The second surface analysis system is connected to the liquid nitrogen STM system by a
transfer system that allows the in-situ exchange of samples. This system is equipped
for chemical composition analysis by AES, and structural characterization by LEED. A sputter gun
and gas dosing systems are available for sample preparation. In addition there is room for metal
evaporators to be inserted onto the chamber to allow the investigation of thin film growth.
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© Shirley Chiang - 1998.