Equipment

• Variable Temperature Scanning Tunneling Microscopy (STM)
• Low Temperature STM
• Low Temperature Atomic Force Microscopy (AFM)
• Surface Analysis
• Auger Electron Spectroscopy (AES) Microscopy
• Low Energy Electron Microscopy (LEEM) / X-Ray Photoemission Spectroscopy (XPS)
• Surface Magneto-Optical Kerr Effect (SMOKE)